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Properties of Accumulation-Mode Multi-Gate Field-Effect Transistors
Colinge, Jean-Pierre, Lederer, Dimitri, Afzalian, Aryan, Yan, Ran, Lee, Chi-Woo, Akhavan, Nima Dehdashti, Xiong, WeizeVolume:
48
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.034502
Date:
March, 2009
File:
PDF, 250 KB
english, 2009