Ion Beam Bombardment Effect on Contacts in Solution-Processed Single-Walled Carbon Nanotube Thin Film Transistor
Yi, Xun, Nakagawa, Gou, Ozawa, Hiroaki, Fujigaya, Tsuyohiko, Nakashima, Naotoshi, Asano, TanemasaVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.098003
Date:
September, 2011
File:
PDF, 838 KB
english, 2011