Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2000 Vol. 448; Iss. 1-2
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The structure study of thin semiconductor and dielectric layers by synchrotron radiation diffraction
G.S Yurjev, V.P Nazmov, V.I Kondratjev, M.A Sheromov, M.A KorchagginVolume:
448
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0168-9002(00)00228-x
File:
PDF, 361 KB
english, 2000