[ACM Press the 2010 ACM Symposium - Sierre, Switzerland (2010.03.22-2010.03.26)] Proceedings of the 2010 ACM Symposium on Applied Computing - SAC '10 - Dual analysis for proving safety and finding bugs
Popeea, Corneliu, Chin, Wei-NganYear:
2010
Language:
english
DOI:
10.1145/1774088.1774538
File:
PDF, 444 KB
english, 2010