Combined Experimental and Theoretical Study of the Si L 23 VV Auger Line Shape during the Ti-Si Interface Formation
Wallart, X, Nys, J. P, Dalmai, G, Lefebvre, I, Lannoo, MVolume:
10
Language:
english
Journal:
Europhysics Letters (EPL)
DOI:
10.1209/0295-5075/10/6/014
Date:
November, 1989
File:
PDF, 894 KB
english, 1989