Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2001 Vol. 461; Iss. 1-3
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Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy
A. Ruzin, N. Croitoru, G. Lubarsky, Y. RosenwaksVolume:
461
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0168-9002(00)01216-x
File:
PDF, 153 KB
english, 2001