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Electrical characterization of strained and unstrained silicon nanowires with nickel silicide contacts
Habicht, S, Zhao, Q T, Feste, S F, Knoll, L, Trellenkamp, S, Ghyselen, B, Mantl, SVolume:
21
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/21/10/105701
Date:
March, 2010
File:
PDF, 456 KB
english, 2010