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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Experimental investigation of water cooled server microprocessors and memory devices in an energy efficient chiller-less data center
Parida, Pritish R., David, Milnes, Iyengar, Madhusudan, Schultz, Mark, Gaynes, Michael, Kamath, Vinod, Kochuparambil, Bejoy, Chainer, TimothyYear:
2012
Language:
english
DOI:
10.1109/STHERM.2012.6188852
File:
PDF, 790 KB
english, 2012