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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Physics and Simulation of Optoelectronic Devices X - Modeling the optoelectronic mixing effect in metal-semiconductor-metal detectors
Aliberti, Keith, Shen, Hongen, Stead, Michael R., Ruff, William C., Stann, Barry L., Blood, Peter, Osinski, Marek, Arakawa, YasuhikoVolume:
4646
Year:
2002
Language:
english
DOI:
10.1117/12.470508
File:
PDF, 111 KB
english, 2002