Surface sensitive mode XAFS measurement of local structure...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2001 Vol. 467-468; Iss. part-P2

Surface sensitive mode XAFS measurement of local structure of ordered Ge nanoclusters (quantum dots) on Si(0 0 1)

S.B. Erenburg, N.V. Bausk, L.N. Mazalov, A.I. Nikiforov, N.P. Stepina, A.V. Nenashev
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Volume:
467-468
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0168-9002(01)00626-x
File:
PDF, 91 KB
english, 2001
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