Inhomogeneity in Semi-Insulating GaAs Revealed by Scanning...

Inhomogeneity in Semi-Insulating GaAs Revealed by Scanning Leakage Current Measurements

Matsumoto, Yoshishige, Watanabe, Hisao
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Volume:
21
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.21.L515
Date:
August, 1982
File:
PDF, 204 KB
english, 1982
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