Measurement of Electron Mobility in p-Si by Time-of-Flight...

Japanese Journal of Applied Physics 1985 / 6 Vol. 24; Iss. Part 1, No

Measurement of Electron Mobility in p-Si by Time-of-Flight Technique

Morohashi, Makoto, Sawaki, Nobuhiko, Akasaki, Isamu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.661
Date:
June, 1985
File:
PDF, 474 KB
1985
Conversion to is in progress
Conversion to is failed