Study of the uniformity of high resistivity neutron doped...

Study of the uniformity of high resistivity neutron doped silicon wafers for silicon drift detectors

S Beolè, V Bonvicini, P Burger, G Casse, P Giubellino, M Idzik, A Kolojvari, A Rashevsky, L Riccati, A Vacchi, N Zampa
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Volume:
473
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0168-9002(01)00797-5
File:
PDF, 280 KB
english, 2001
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