![](/img/cover-not-exists.png)
[ACM Press the 32nd ACM/IEEE conference - San Francisco, California, United States (1995.06.12-1995.06.16)] Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 - Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
Venkataraman, Srikanth, Hartanto, Ismed, Fuchs, W. Kent, Rudnick, Elizabeth M., Chakravarty, Sreejit, Patel, Janak H.Year:
1995
Language:
english
DOI:
10.1145/217474.217519
File:
PDF, 243 KB
english, 1995