Microscopic parameters of heterostructures containing...

Microscopic parameters of heterostructures containing nanoclusters and thin layers of Ge in Si matrix

S.B. Erenburg, N.V. Bausk, N.P. Stepina, A.I. Nikiforov, A.V. Nenashev, L.N. Mazalov
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Volume:
470
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0168-9002(01)01080-4
File:
PDF, 160 KB
english, 2001
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