Dynamical diffraction imaging of voids in nearly perfect...

Journal of Physics D Applied Physics 2001 / 05 Vol. 34; Iss. 10A

Dynamical diffraction imaging of voids in nearly perfect silicon

Tuomi, T, Rantamäki, R, McNally, P J, Lowney, D, Danilewsky, A N, Becker, P
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Volume:
34
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/34/10A/327
Date:
May, 2001
File:
PDF, 85 KB
english, 2001
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