SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Polarization Science and Remote Sensing VI - Optical characterization of amber from Chiapas, Mexico
López-Morales, Guadalupe, Espinosa-Luna, Rafael, Frausto-Reyes, Claudio, Shaw, Joseph A., LeMaster, Daniel A.Volume:
8873
Year:
2013
Language:
english
DOI:
10.1117/12.2024701
File:
PDF, 784 KB
english, 2013