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Nature of Secondary Defects in Silicon Produced by High Temperature Electron Irradiation
Furuno, Shigemi, Izui, Kazuhiko, Otsu, HitoshiVolume:
18
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.18.203
Date:
January, 1979
File:
PDF, 691 KB
1979