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Measurement of Electron Mobility in Hydrogenated Amorphous-Silicon Using 4-Terminal Transistor Structures
Uchida, Yasutaka, Matsumura, MasakiyoVolume:
23
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.23.L206
Date:
April, 1984
File:
PDF, 238 KB
english, 1984