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Structural Study of PtSi/(111)Si Interface with High-Resolution Electron Microscopy
Kawarada, Hiroshi, Ohdomari, Iwao, Horiuchi, ShigeoVolume:
23
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.23.L799
Date:
October, 1984
File:
PDF, 866 KB
1984