Effects of Light Impurities on Electron Temperature Measured by Soft X-Ray Filter Method
Morimoto, Shigeyuki, Okamoto, Shingo, Yanagi, Nagato, Iiyoshi, Atsuo, Uo, KojiVolume:
25
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.25.120
Date:
January, 1986
File:
PDF, 391 KB
english, 1986