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Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AlGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate
Tanaka, Shigeyasu, Honda, Yoshio, Kameshiro, Norifumi, Iwasaki, Ryuta, Sawaki, Nobuhiko, Tanji, TakayoshiVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.L846
Date:
July, 2002
File:
PDF, 261 KB
english, 2002