Back-Gate Effect on Coulomb Blockade in...

Japanese Journal of Applied Physics 2005 / 10 Vol. 44; Iss. 10

Back-Gate Effect on Coulomb Blockade in Silicon-on-Insulator Trench Wires

Nishiguchi, Katsuhiko, Crauste, Olivier, Namatsu, Hideo, Horiguchi, Seiji, Ono, Yukinori, Fujiwara, Akira, Takahashi, Yasuo, Inokawa, Hiroshi
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Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.7717
Date:
October, 2005
File:
PDF, 223 KB
english, 2005
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