![](/img/cover-not-exists.png)
The Layout Geometry and Power-Level Dependences of Degradation in Complementary Metal–Oxide–Semiconductor RF Power Cells from Hot-Carrier Stress with Load Pull System
Liu, Chien-Hsuan, Su, Yan-Kuin, Wang, Ruey-Lue, To, Chih-Ho, Juang, Ying-ZongVolume:
49
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.49.04DC27
Date:
April, 2010
File:
PDF, 249 KB
english, 2010