Diffusion Resistance of Low Temperature Chemical Vapor Deposition Dielectrics for Multiple Through Silicon Vias on Bumpless Wafer-on-Wafer Technology
Kitada, Hideki, Maeda, Nobuhide, Fujimoto, Koji, Mizushima, Yoriko, Nakata, Yoshihiro, Nakamura, Tomoji, Ohba, TakayukiVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.05ED02
Date:
May, 2011
File:
PDF, 898 KB
english, 2011