Transmission electron microscope investigation of...

Transmission electron microscope investigation of indentation induced dislocation configurations on the (001) GaSb face

Doerschel, J.
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Volume:
209
Language:
english
Journal:
Zeitschrift für Kristallographie
DOI:
10.1524/zkri.1994.209.3.210
Date:
January, 1994
File:
PDF, 6.78 MB
english, 1994
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