Measurement of the single event upset cross-section in the...

Measurement of the single event upset cross-section in the SVX IIe chip

A. Juste, S.M. Tripathi, D.A. Wijngaarden
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Volume:
500
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0168-9002(03)00298-5
File:
PDF, 176 KB
english, 2003
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