![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - A 109 nW, 44 ppm/?C CMOS Current Reference with Low Sensitivity to Process Variations
De Vita, Giuseppe, Iannaccone, GiuseppeYear:
2007
Language:
english
DOI:
10.1109/ISCAS.2007.378790
File:
PDF, 349 KB
english, 2007