Electron Trapping Induced by High-Energy Ionizing Radiation...

Japanese Journal of Applied Physics 1985 / 9 Vol. 24; Iss. Part 1, No

Electron Trapping Induced by High-Energy Ionizing Radiation in SiO 2

Shimaya, Masakazu, Shiono, Noboru
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Volume:
24
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.1193
Date:
September, 1985
File:
PDF, 898 KB
english, 1985
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