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An X-Ray Stress Measurement Method for Very Small Areas on Single Crystals
Yoshiike, Takahisa, Fujii, Nobuyuki, Kozaki, ShigeruVolume:
36
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.36.5764
Date:
September, 1997
File:
PDF, 878 KB
1997