Scanning Tunneling Microscopy and Barrier-Height Study of...

Japanese Journal of Applied Physics 2000 / 6 Vol. 39; Iss. Part 1, No

Scanning Tunneling Microscopy and Barrier-Height Study of K-Adsorbed Si(111) 7×7

Kurokawa, Shu, Yoshikawa, Jun, Sakai, Akira
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.39.3736
Date:
June, 2000
File:
PDF, 95 KB
english, 2000
Conversion to is in progress
Conversion to is failed