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The Impact of Random Telegraph Signals on the Threshold Voltage Variation of 65 nm Multilevel NOR Flash Memory
Cai, Yimao, Song, Yun Heub, Kwon, Wook-Hyun, Lee, Bong Yong, Park, Chan-KwangVolume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.2733
Date:
April, 2008
File:
PDF, 341 KB
english, 2008