Growth and Property Characterization of Epitaxial MAX-Phase...

Advances in Science and Technology 2006 Vol. 45

Growth and Property Characterization of Epitaxial MAX-Phase Thin Films from the Tin+1(Si, Ge, Sn)Cn Systems

Högberg, H., Emmerlich, J., Eklund, P., Wilhelmsson, Ola, Palmquist, Jens Petter, Jansson, Ulf, Hultman, L.
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Volume:
45
Year:
2006
Language:
english
Journal:
Advances in Science and Technology
DOI:
10.4028/www.scientific.net/AST.45.2648
File:
PDF, 478 KB
english, 2006
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