Radiation damage of silicon microstrip detectors by high...

Radiation damage of silicon microstrip detectors by high doses of 200 MeV electrons

T Takahashi, M Ukai, A Yoshida, Y Fujii, K Dobashi, O Hashimoto, K Maeda, A Miyamoto, T Miyoshi, S.N Nakamura, Y Okayasu, T Tamae, H Tamura, K Tsukada, T Watanabe
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Volume:
511
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0168-9002(03)01975-2
File:
PDF, 228 KB
english, 2003
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