Damage depth profiles of shallow-implanted or...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1996 Vol. 380; Iss. 1-2

Damage depth profiles of shallow-implanted or compositional-graded surfaces for X-ray and γ-ray detectors

A Konova, D Tonova, J Karmakov
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Volume:
380
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/s0168-9002(96)00339-7
File:
PDF, 456 KB
english, 1996
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