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Life-data analysis for condition assessment of high-voltage assets
Chmura, Lukasz, Morshuis, Peter H. F., Smit, Johan J., Janssen, AntonVolume:
31
Language:
english
Journal:
IEEE Electrical Insulation Magazine
DOI:
10.1109/MEI.2015.7214443
Date:
September, 2015
File:
PDF, 3.22 MB
english, 2015