[IEEE 2015 Third International Conference on Technological...

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[IEEE 2015 Third International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - Beirut, Lebanon (2015.4.29-2015.5.1)] 2015 Third International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - Distinctive study of UPFC and fault analysis under simulated environment

Chowdhury, Md. Saifur Rahman, Howlader, Md Masum, Hasan, A K M Kamrul, Ferdaus, Md. Rasel
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Year:
2015
Language:
english
DOI:
10.1109/TAEECE.2015.7113635
File:
PDF, 960 KB
english, 2015
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