SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 9 August 2015)] Nanoengineering: Fabrication, Properties, Optics, and Devices XII - Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate
Campo, Eva M., Dobisz, Elizabeth A., Eldada, Louay A., Vázquez-Estrada, Omar, Morales-Luna, Gesuri, Calles-Martínez, Alipio, Reyes-Coronado, Alejandro, García-Valenzuela, AugustoVolume:
9556
Year:
2015
Language:
english
DOI:
10.1117/12.2186863
File:
PDF, 1.96 MB
english, 2015