SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Industrial interferometry systems for multi-axis measurement

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Oulehla, Jindřich, Holá, Miroslava, Hrabina, Jan, Lazar, Josef, Číp, Ondřej, Vychodil, Miloslav, Sedlár, Petr, Provaznik, Milan
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Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2190747
File:
PDF, 3.92 MB
english, 2015
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