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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - An instrument for surface roughness measurement of optical thin films
Hou, Haihong, Yi, Kui, Shao, Jianda, Fan, Zhengxiu, Wang, Yongtian, Weng, Zhicheng, Ye, Shenghua, Sasian, Jose M.Volume:
5638
Year:
2005
Language:
english
DOI:
10.1117/12.572611
File:
PDF, 121 KB
english, 2005