Analysis of Capacitive Coupling Voltage Contrast in Scanning Electron Microscopy
Watanabe, Yoshio, Fukuda, Yukio, Jinno, TakamitsuVolume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.1294
Date:
October, 1985
File:
PDF, 618 KB
1985