Observation of X-Ray Diffraction Spots from the ($\sqrt{3} \times \sqrt{3}$)R30° Bi Structure on the Si(111) Surface under the Condition of Large Incidence Angle
Takahashi, Toshio, Takayama, Isamu, Ishikawa, Tetsuya, Ohta, Toshiaki, Kikuta, SeishiVolume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.L727
Date:
September, 1985
File:
PDF, 462 KB
1985