Evidence for Phosphorus Passivation of Plasma-Induced Damage at GaAs Surface Probed by EL2 Traps
Sugino, Takashi, Yamada, Takashi, Matsuda, Koichiro, Shirafuji, JunjiVolume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L1575
Date:
September, 1990
File:
PDF, 498 KB
1990