Measurement of the Minority-Carrier Lifetime in a...

Japanese Journal of Applied Physics 1990 / 1 Vol. 29; Iss. Part 2, No

Measurement of the Minority-Carrier Lifetime in a Semiconductor Wafer by a Two-Mercury-Probe Method and Its Application to Evaluation of the Surface Recombination Velocity

Suzuki, Eiichi, Hayashi, Yutaka
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Volume:
29
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L162
Date:
January, 1990
File:
PDF, 349 KB
english, 1990
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