Novel Electron Beam Direct Writing Technique for the Hole Pattern of Quarter-Micron Devices
Fujino, Takeshi, Ishii, Atsushi, Kawai, Kenji, Matsuba, Motoko, Nakao, Shuji, Watakabe, Yaichiro, Akasaka, YoichiVolume:
31
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.4262
Date:
December, 1992
File:
PDF, 1.38 MB
1992