Strong Low-Frequency Noise in Polysilicon Emitter Bipolar Transistors with Interfacial Oxide due to Fluctuations in Tunneling Probabilities
Lau, Wai Shing, Chor, Eng Fong, Foo, Chee Seng, Khoong, Wai CheeVolume:
31
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L1021
Date:
August, 1992
File:
PDF, 609 KB
english, 1992