Low-Temperature Metal-Oxide-Semiconductor Field-Effect...

Japanese Journal of Applied Physics 1993 / 1 Vol. 32; Iss. Part 1, No

Low-Temperature Metal-Oxide-Semiconductor Field-Effect Transistor Operation by Temperature Scaling Theory

Yokoyama, Michio, Hidaka, Tetsuya, Yi, You-Wen, Masu, Kazuya, Tsubouchi, Kazuo
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Volume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.419
Date:
January, 1993
File:
PDF, 264 KB
english, 1993
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