A Semi-Analytical Approach to Compute the Decay of...

Japanese Journal of Applied Physics 1993 / 6 Vol. 32; Iss. Part 2, No

A Semi-Analytical Approach to Compute the Decay of Optically Generated Carriers in Silicon Wafer

Morin, Michel, Koyanagi, Mitsu, Hirose, Masataka
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Volume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L816
Date:
June, 1993
File:
PDF, 322 KB
english, 1993
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