High-Accuracy X-ray Reflectivity Study of Native Oxide Formed in Chemical Treatment
Awaji, Naoki, Sugita, Yoshihiro, Ohkubo, Satosi, Nakanishi, Toshiro, Takasaki, Kanetake, Komiya, SatoshiVolume:
34
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.34.L1013
Date:
August, 1995
File:
PDF, 692 KB
1995