4.5 kV Injection Enhanced Gate Transistor: Experimental Verification of the Electrical Characteristics
Kitagawa, Mitsuhiko, Hasegawa, Shigeru, Inoue, Tomoki, Yahata, Akihiro, Ohashi, HiromichiVolume:
36
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.36.3433
Date:
June, 1997
File:
PDF, 948 KB
1997